TY - BOOK ID - 8286095 TI - EMI-Resilient Amplifier Circuits AU - van der Horst, Marcel J. AU - Serdijn, Wouter A. AU - Linnenbank, André C. PY - 2014 SN - 3319005928 3319005936 3319033662 PB - Cham : Springer International Publishing : Imprint: Springer, DB - UniCat KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Electrical Engineering KW - Electronic circuits. KW - Electromagnetic interference. KW - Interference, Electromagnetic KW - Electron-tube circuits KW - Engineering. KW - Electronics. KW - Microelectronics. KW - Circuits and Systems. KW - Electronics and Microelectronics, Instrumentation. KW - Electronic Circuits and Devices. KW - Electric circuits KW - Electron tubes KW - Electronics KW - Microminiature electronic equipment KW - Microminiaturization (Electronics) KW - Microtechnology KW - Semiconductors KW - Miniature electronic equipment KW - Electrical engineering KW - Physical sciences KW - Construction KW - Industrial arts KW - Technology KW - Electric interference KW - Electromagnetic compatibility KW - Electromagnetic noise KW - Signal integrity (Electronics) KW - Systems engineering. KW - Engineering systems KW - System engineering KW - Engineering KW - Industrial engineering KW - System analysis KW - Design and construction UR - https://www.unicat.be/uniCat?func=search&query=sysid:8286095 AB - This book enables circuit designers to reduce the errors introduced by the fundamental limitations and electromagnetic interference (EMI) in negative-feedback amplifiers. The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER). This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in application specific amplifiers in order to meet the SER requirements. · Describes design methods that incorporate electromagnetic interference (EMI) in the design of application specific negative-feedback amplifiers; · Provides designers with a structured methodology to avoid the use of trial and error in meeting signal-to-error ratio (SER) requirements; · Equips designers to increase EMI immunity of the amplifier itself, thus avoiding filtering at the input, reducing the number of components and avoiding detrimental effects on noise and stability. . ER -