TY - JFULL ID - 817627 TI - Scanning electron microscopy PY - 1986 SN - 05865581 PB - AMF O'Hare (Ill.): Scanning electron microscopy, DB - UniCat KW - Experimental solid state physics KW - Optics. Quantum optics KW - Materials sciences KW - Biological microscopy KW - Microscopy KW - Microscopy, Electron, Scanning KW - Scanning electron microscopy KW - Microscopie électronique à balayage KW - congresses KW - Congresses KW - Congrès KW - periodicals KW - Periodicals KW - Périodiques KW - Conferences - Meetings KW - Microscopie électronique à balayage KW - Congrès KW - MDIMAGIN KW - Périodiques KW - congresses. KW - Congresses. KW - periodicals. UR - https://www.unicat.be/uniCat?func=search&query=sysid:817627 AB - Vols. for 1971 includes the proceedings of the Workshop on Forensic Applications of the Scanning Electron Microscope; 1972 the proceedings of the Workshop on Biological Specimen Preparation for Scanning Electron Microscopy ER -