TY - BOOK ID - 7953583 TI - Systematic materials analysis. 003. Vol. 3 AU - PETERSON, R. V. AU - Richardson, J. H. PY - 1974 SN - 0125878036 1322290776 1483219828 PB - New York, NY : Academic Press, DB - UniCat KW - EMISSION SPECTRA KW - SURFACE PROPERTIES KW - INTERFACES KW - MICROANALYSIS KW - PHOTOMETRY KW - CHROMATOGRAPHY KW - MOESSBAUER EFFECT KW - X-radiations KW - MICROSCOPY KW - Monograph KW - Photometry. KW - Chromatographic analysis. KW - Microscopy. KW - Analysis, Chromatographic KW - Chromatography KW - Chemistry, Analytic KW - Phase partition KW - Electric light KW - Light, Electric KW - Electromagnetic measurements KW - Radiation KW - Analysis, Microscopic KW - Light microscopy KW - Micrographic analysis KW - Microscope and microscopy KW - Microscopic analysis KW - Optical microscopy KW - Optics KW - Measurement KW - Analytical chemistry KW - Computer software. KW - Gas chromatography. KW - Materials. KW - Analysis KW - Gas analysis KW - Spectrometry KW - X-ray analysis UR - https://www.unicat.be/uniCat?func=search&query=sysid:7953583 AB - ER -