TY - BOOK ID - 7911283 TI - Analog IC reliability in nanometer CMOS AU - Maricau, Elie. AU - Gielen, Georges. PY - 2013 SN - 1489986308 1461461626 1461461634 1299197396 PB - New York, NY : Springer Science, DB - UniCat KW - Electronics -- Materials -- Testing -- Congresses. KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Electrical Engineering KW - Linear integrated circuits KW - Metal oxide semiconductors, Complementary. KW - Reliability. KW - CMOS (Electronics) KW - Complementary metal oxide semiconductors KW - Semiconductors, Complementary metal oxide KW - Linear ICs KW - Engineering. KW - Nanotechnology. KW - Electronics. KW - Microelectronics. KW - Electronic circuits. KW - Circuits and Systems. KW - Electronics and Microelectronics, Instrumentation. KW - Nanotechnology and Microengineering. KW - Electron-tube circuits KW - Electric circuits KW - Electron tubes KW - Electronics KW - Microminiature electronic equipment KW - Microminiaturization (Electronics) KW - Microtechnology KW - Semiconductors KW - Miniature electronic equipment KW - Electrical engineering KW - Physical sciences KW - Molecular technology KW - Nanoscale technology KW - High technology KW - Construction KW - Industrial arts KW - Technology KW - Digital electronics KW - Logic circuits KW - Transistor-transistor logic circuits KW - Analog integrated circuits KW - Systems engineering. KW - Engineering systems KW - System engineering KW - Engineering KW - Industrial engineering KW - System analysis KW - Design and construction UR - https://www.unicat.be/uniCat?func=search&query=sysid:7911283 AB - This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. · Enables readers to understand long-term reliability of an integrated circuit; · Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; · Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; · Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit. ER -