TY - BOOK ID - 7834601 TI - Photoelectron Spectroscopy : Bulk and Surface Electronic Structures AU - Suga, Shigemasa. AU - Sekiyama, Akira. PY - 2014 SN - 3642375294 3642375308 PB - Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, DB - UniCat KW - Physics. KW - Chemistry, Physical organic. KW - Surfaces (Physics). KW - Optics, Optoelectronics, Plasmonics and Optical Devices. KW - Optics and Electrodynamics. KW - Surface and Interface Science, Thin Films. KW - Quantum Optics. KW - Physical Chemistry. KW - Characterization and Evaluation of Materials. KW - Engineering & Applied Sciences KW - Physics KW - Physical Sciences & Mathematics KW - Applied Physics KW - Light & Optics KW - Chemistry, Physical organic KW - Natural philosophy KW - Philosophy, Natural KW - Physical chemistry. KW - Quantum optics. KW - Interfaces (Physical sciences). KW - Thin films. KW - Materials science. KW - Optics, Lasers, Photonics, Optical Devices. KW - Classical Electrodynamics. KW - Photoelectron spectroscopy. KW - Spectroscopy, Photoelectron KW - Electron spectroscopy KW - Molecular orbitals KW - Molecular spectra KW - Molecular spectroscopy KW - Photoelectricity KW - Spectrum analysis KW - Surface chemistry KW - Surfaces (Technology) KW - Chemistry, Organic KW - Chemistry, Physical and theoretical KW - Lasers. KW - Photonics. KW - Optics. KW - Electrodynamics. KW - Material science KW - Physical sciences KW - Chemistry, Theoretical KW - Physical chemistry KW - Theoretical chemistry KW - Chemistry KW - Optics KW - Photons KW - Quantum theory KW - Films, Thin KW - Solid film KW - Solid state electronics KW - Solids KW - Coatings KW - Thick films KW - Surfaces (Physics) KW - Dynamics KW - Light KW - New optics KW - Light amplification by stimulated emission of radiation KW - Masers, Optical KW - Optical masers KW - Light amplifiers KW - Light sources KW - Optoelectronic devices KW - Nonlinear optics KW - Optical parametric oscillators UR - https://www.unicat.be/uniCat?func=search&query=sysid:7834601 AB - Photoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy. ER -