TY - BOOK ID - 77865528 TI - Scanning force microscopy : with applications to electric, magnetic, and atomic forces PY - 2023 SN - 128044178X 0198022816 9786610441785 0195344693 1602566283 9780198022817 9780195092042 019509204X 019509204X 0197732615 PB - New York ; Oxford University Press, DB - UniCat KW - Scanning force microscopy. KW - Surfaces (Physics) KW - Physics KW - Surface chemistry KW - Surfaces (Technology) KW - SFM (Microscopy) KW - Scanning tunneling microscopy KW - Experimental solid state physics UR - https://www.unicat.be/uniCat?func=search&query=sysid:77865528 AB - Includes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM. ER -