TY - BOOK ID - 7254681 TI - Hot-carrier reliability of MOS VLSI circuits AU - Leblebici, Yusuf AU - Kang, Sung-Mo PY - 1993 VL - SECS 227 SN - 079239352X 1461364299 1461532507 9780792393528 PB - Boston: Kluwer, DB - UniCat KW - Integrated circuits KW - Metal oxide semiconductors KW - Hot carriers KW - Very large scale integration KW - Defects KW - Mathematical models KW - Reliability KW - -Metal oxide semiconductors KW - -Unipolar transistors KW - Semiconductors KW - Transistors KW - Charge coupled devices KW - Carriers, Hot KW - Hot carrier conduction KW - Hot electrons KW - Electrons KW - Holes (Electron deficiencies) KW - -Mathematical models KW - -Reliability KW - Unipolar transistors KW - Chips (Electronics) KW - Circuits, Integrated KW - Computer chips KW - Microchips KW - Electronic circuits KW - Microelectronics KW - Reliability&delete& KW - Very large scale integration&delete& KW - Defects&delete& KW - Integrated circuits - Very large scale integration - Defects - Mathematical models KW - Metal oxide semiconductors - Reliability - Mathematical models KW - Hot carriers - Reliability - Mathematical models UR - https://www.unicat.be/uniCat?func=search&query=sysid:7254681 AB - ER -