TY - BOOK ID - 65605799 TI - Pattern recognition and computer vision. : Third Chinese Conference, PRCV 2020, Nanjing, China, October 16-18, 2020, proceedings PY - 2020 SN - 3030606392 3030606384 PB - Cham, Switzerland : Springer, DB - UniCat KW - Optical data processing. KW - Application software. KW - Education—Data processing. KW - Machine learning. KW - Computer communication systems. KW - Architecture, Computer. KW - Image Processing and Computer Vision. KW - Computer Appl. in Social and Behavioral Sciences. KW - Computers and Education. KW - Machine Learning. KW - Computer Communication Networks. KW - Computer System Implementation. KW - Architecture, Computer KW - Communication systems, Computer KW - Computer communication systems KW - Data networks, Computer KW - ECNs (Electronic communication networks) KW - Electronic communication networks KW - Networks, Computer KW - Teleprocessing networks KW - Data transmission systems KW - Digital communications KW - Electronic systems KW - Information networks KW - Telecommunication KW - Cyberinfrastructure KW - Electronic data processing KW - Network computers KW - Learning, Machine KW - Artificial intelligence KW - Machine theory KW - Application computer programs KW - Application computer software KW - Applications software KW - Apps (Computer software) KW - Computer software KW - Optical computing KW - Visual data processing KW - Bionics KW - Integrated optics KW - Photonics KW - Computers KW - Distributed processing KW - Optical equipment KW - Pattern recognition systems UR - https://www.unicat.be/uniCat?func=search&query=sysid:65605799 AB - The three-volume set LNCS 12305, 12306, and 12307 constitutes the refereed proceedings of the Third Chinese Conference on Pattern Recognition and Computer Vision, PRCV 2020, held virtually in Nanjing, China, in October 2020. The 158 full papers presented were carefully reviewed and selected from 402 submissions. The papers have been organized in the following topical sections: Part I: Computer Vision and Application, Part II: Pattern Recognition and Application, Part III: Machine Learning. ER -