TY - BOOK ID - 64871567 TI - 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) : 28-30 Sept. 2016 PY - 2016 SN - 1509018808 1509018816 PB - Piscataway, New Jersey : IEEE, DB - UniCat KW - Accelerated life testing UR - https://www.unicat.be/uniCat?func=search&query=sysid:64871567 AB - Annotation Accelerated stress testing is a key tool within a well structured development program, being able to focus timely opportunities for product improvement and being able to deliver assured product performance This year s workshop will deliver detailed case studies, best practices, lessons learned and clear insight designed. ER -