TY - BOOK ID - 61115873 TI - Atomic force microscopy in process engineering : introduction to AFM for improved processes and products AU - Bowen, W. Richard. AU - Hilal, Nidal. PY - 2009 SN - 1282288806 9786612288807 0080949576 1856175170 9780080949574 9781856175173 PB - Amsterdam ; Boston : Elsevier/BH, DB - UniCat KW - Atomic force microscopy. KW - Production engineering. KW - Manufacturing engineering KW - Process engineering KW - Industrial engineering KW - Mechanical engineering KW - AFM (Microscopy) KW - Scanning probe microscopy UR - https://www.unicat.be/uniCat?func=search&query=sysid:61115873 AB - Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practis ER -