TY - BOOK ID - 48259530 TI - Ageing of Integrated Circuits : Causes, Effects and Mitigation Techniques PY - 2020 SN - 3030237818 303023780X PB - Cham : Springer International Publishing : Imprint: Springer, DB - UniCat KW - Systems engineering. KW - Computer science. KW - Electronics. KW - Circuits and Systems. KW - Processor Architectures. KW - Electronics and Microelectronics, Instrumentation. KW - Electrical engineering KW - Physical sciences KW - Informatics KW - Science KW - Engineering systems KW - System engineering KW - Engineering KW - Industrial engineering KW - System analysis KW - Design and construction KW - Integrated circuits. KW - Chips (Electronics) KW - Circuits, Integrated KW - Computer chips KW - Microchips KW - Electronic circuits KW - Microelectronics KW - Electronic circuits. KW - Microprocessors. KW - Microelectronics. KW - Microminiature electronic equipment KW - Microminiaturization (Electronics) KW - Electronics KW - Microtechnology KW - Semiconductors KW - Miniature electronic equipment KW - Minicomputers KW - Electron-tube circuits KW - Electric circuits KW - Electron tubes UR - https://www.unicat.be/uniCat?func=search&query=sysid:48259530 AB - This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading. ER -