TY - BOOK ID - 27872779 TI - Surface and thin film analysis : principles, intrumentation, applications. AU - Bubert, Henning AU - Jenett, Holger PY - 2003 SN - 3527304584 9783527304585 PB - Weinheim Wiley-VCH DB - UniCat KW - Spectroscopie électronique KW - Spectroscopie électronique KW - Thin films KW - Electron spectroscopy. KW - Spectrum analysis. KW - Electron spectroscopy KW - Spectrum analysis KW - Surfaces KW - Analysis. KW - Films, Thin KW - Solid film KW - Solid state electronics KW - Solids KW - Surfaces (Technology) KW - Coatings KW - Thick films KW - Analysis, Spectrum KW - Spectra KW - Spectrochemical analysis KW - Spectrochemistry KW - Spectroscopy KW - Chemistry, Analytic KW - Interferometry KW - Optics KW - Radiation KW - Wave-motion, Theory of KW - Absorption spectra KW - Light KW - Spectroscope KW - Electron spectroscopy for chemical analysis KW - ESCA KW - Electrons KW - X-rays KW - Surfaces&delete& KW - Analysis KW - Qualitative KW - Emission KW - Analyse spectrale KW - Spectrometry KW - Analytical chemistry KW - Thin films - Surfaces - Analysis. UR - https://www.unicat.be/uniCat?func=search&query=sysid:27872779 AB - ER -