TY - BOOK ID - 211509 TI - Powder Diffraction : The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data PY - 2006 SN - 1280460415 9786610460410 3540279865 3540279857 3642066267 PB - Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, DB - UniCat KW - Rietveld method. KW - X-rays KW - Diffraction. KW - Diffraction KW - PFSR (X-ray crystallography) KW - Profile refinement (X-ray crystallography) KW - Rietveld analysis KW - Rietveld refinement KW - Whole-pattern-fitting structure refinement (X-ray crystallography) KW - X-ray crystallography KW - Technique KW - Mineralogy. KW - Crystallography. KW - Chemistry, inorganic. KW - Chemistry, Physical organic. KW - Crystallography and Scattering Methods. KW - Inorganic Chemistry. KW - Physical Chemistry. KW - Chemistry, Physical organic KW - Chemistry, Organic KW - Chemistry, Physical and theoretical KW - Inorganic chemistry KW - Chemistry KW - Inorganic compounds KW - Leptology KW - Physical sciences KW - Mineralogy KW - Physical geology KW - Crystallography KW - Minerals KW - Inorganic chemistry. KW - Physical chemistry. KW - Chemistry, Theoretical KW - Physical chemistry KW - Theoretical chemistry UR - https://www.unicat.be/uniCat?func=search&query=sysid:211509 AB - Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application. ER -