TY - BOOK ID - 207158 TI - Fault diagnosis of analog integrated circuits AU - Kabisatpathy, Prithviraj. AU - Barua, Alok. AU - Sinha, Satyabroto. PY - 2005 SN - 1280459506 9786610459506 0387257438 038725742X 1441938281 PB - Dordrecht : Springer, DB - UniCat KW - Linear integrated circuits. KW - Linear integrated circuits KW - Testing. KW - Linear ICs KW - Analog integrated circuits KW - Systems engineering. KW - Engineering design. KW - Electronics. KW - Computer engineering. KW - Circuits and Systems. KW - Engineering Design. KW - Electronics and Microelectronics, Instrumentation. KW - Electrical Engineering. KW - Computers KW - Electrical engineering KW - Physical sciences KW - Design, Engineering KW - Engineering KW - Industrial design KW - Strains and stresses KW - Engineering systems KW - System engineering KW - Industrial engineering KW - System analysis KW - Design and construction KW - Design KW - Electronic circuits. KW - Microelectronics. KW - Electrical engineering. KW - Electric engineering KW - Microminiature electronic equipment KW - Microminiaturization (Electronics) KW - Electronics KW - Microtechnology KW - Semiconductors KW - Miniature electronic equipment KW - Electron-tube circuits KW - Electric circuits KW - Electron tubes UR - https://www.unicat.be/uniCat?func=search&query=sysid:207158 AB - System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort. Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. ER -