TY - BOOK ID - 17801798 TI - Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists AU - Goldstein, Joseph AU - Echlin, Patrick AU - Fiori, Charles AU - Joy, David C. AU - Lifshin, Eric AU - Lyman, Charles E. AU - Newbury, Dale E. AU - ROMIG, A. D. PY - 1992 SN - 0306441756 1461276535 1461304911 9780306441752 PB - New York, NY : Plenum Press, DB - UniCat KW - Scanning electron microscopy. KW - X-ray microanalysis. KW - Scanning electron microscopy KW - X-ray microanalysis KW - 537.533.35 KW - 543.063 KW - 549.08 KW - Electron microscopy KW - 537.533.35 Electron microscopy KW - 549.08 Mineralogy. Special study of minerals--?.08 KW - Mineralogy. Special study of minerals--?.08 KW - 543.063 Analytical chemistry--?.063 KW - Analytical chemistry--?.063 KW - Microprobe analysis KW - Experimental solid state physics KW - Spectrometric and optical chemical analysis KW - fysicochemie KW - SCANNING ELECTRON MICROSCOPY KW - Monograph UR - https://www.unicat.be/uniCat?func=search&query=sysid:17801798 AB - ER -