TY - BOOK ID - 146253418 TI - Challenges and New Trends in Power Electronic Devices Reliability AU - Falco, Pasquale De AU - Chiodo, Elio AU - Di Noia, Luigi Pio PY - 2021 PB - Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute DB - UniCat KW - Technology: general issues KW - Energy industries & utilities KW - photovoltaic system KW - battery KW - DC-coupled configuration KW - AC-coupled configuration KW - mission profile KW - reliability KW - LED KW - thermal cycling test KW - accelerated test KW - solder joint KW - cracks KW - current harmonics KW - voltage harmonics KW - power electronic converters KW - cables KW - capacitors KW - PPS KW - high-power thyristors KW - reverse recovery currents KW - electromagnetic launching field KW - segmented LSTM KW - microgrid inverter KW - IGBT reliability KW - online evaluation KW - fusion algorithm KW - multi-chip IGBT module KW - bond wire KW - module transconductance KW - temperature calibration KW - failure monitoring KW - sensor lamp KW - low-light mode KW - high-light mode KW - AC motor drive KW - junction temperature KW - lifetime prediction KW - power MOSFET KW - loss modeling KW - SiC MOSFET KW - AlGaN/GaN HEMT KW - cascode structure KW - single event effects KW - technology computer-aided design simulation KW - heavy-ion irradiation experiment KW - photovoltaic systems KW - DC/AC converter KW - maintenance KW - power system faults KW - availability KW - condition monitoring KW - power device KW - power electronics KW - photovoltaic system KW - battery KW - DC-coupled configuration KW - AC-coupled configuration KW - mission profile KW - reliability KW - LED KW - thermal cycling test KW - accelerated test KW - solder joint KW - cracks KW - current harmonics KW - voltage harmonics KW - power electronic converters KW - cables KW - capacitors KW - PPS KW - high-power thyristors KW - reverse recovery currents KW - electromagnetic launching field KW - segmented LSTM KW - microgrid inverter KW - IGBT reliability KW - online evaluation KW - fusion algorithm KW - multi-chip IGBT module KW - bond wire KW - module transconductance KW - temperature calibration KW - failure monitoring KW - sensor lamp KW - low-light mode KW - high-light mode KW - AC motor drive KW - junction temperature KW - lifetime prediction KW - power MOSFET KW - loss modeling KW - SiC MOSFET KW - AlGaN/GaN HEMT KW - cascode structure KW - single event effects KW - technology computer-aided design simulation KW - heavy-ion irradiation experiment KW - photovoltaic systems KW - DC/AC converter KW - maintenance KW - power system faults KW - availability KW - condition monitoring KW - power device KW - power electronics UR - https://www.unicat.be/uniCat?func=search&query=sysid:146253418 AB - The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components. ER -