TY - BOOK ID - 146035788 TI - Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California AU - Rajsuman, Rochit AU - IEEE International Workshop on Memory Technology, Design and Testing AU - IEEE International Workshop on Memory Technology, Design, and Testing AU - IEEE Computer Society Test Technology Technical Committee AU - IEEE Computer Society Technical Committee on VLSI PY - 1994 PB - [Place of publication not identified] IEEE Computer Society Press DB - UniCat KW - Semiconductor storage devices KW - Random access memory KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Electrical Engineering KW - Congresses KW - Testing KW - Testing. KW - Congresses. UR - https://www.unicat.be/uniCat?func=search&query=sysid:146035788 AB - ER -