TY - BOOK ID - 145715381 TI - Extended defects in semiconductors : electronic properties, device effects and structures AU - Holt, D. B. AU - Yacobi, B. G. PY - 2007 SN - 1107159377 1280850515 9786610850518 0511278683 0511279280 0511277512 0511321716 0511276885 051153485X 0511278101 PB - Cambridge : Cambridge University Press, DB - UniCat KW - Semiconductors KW - Defects. KW - Failures. UR - https://www.unicat.be/uniCat?func=search&query=sysid:145715381 AB - The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics. ER -