TY - BOOK ID - 145512649 TI - Reliability Analysis of Electrotechnical Devices PY - 2022 PB - Basel MDPI - Multidisciplinary Digital Publishing Institute DB - UniCat KW - Technology: general issues KW - History of engineering & technology KW - 3D-IC (three-dimensional integrated circuit) KW - electromagnetic interference KW - near field measurement KW - SAC305 KW - BGA KW - low temperature KW - fracture failure KW - factorial design of experiment KW - genetic algorithm optimization KW - return loss KW - multiple-input multiple-output (MIMO) KW - single event effects KW - linear energy transfer KW - Monte Carlo simulation KW - radiation hardness KW - pressureless sintered micron silver joints KW - deep space environment KW - extreme thermal shocks KW - reconstruction KW - simulation KW - elastic mechanical properties KW - state of health KW - remaining useful life KW - electrochemistry based electrical model KW - semi-empirical capacity fading model KW - useful life distribution KW - quality and reliability assurance KW - single event effect KW - microdosimetry KW - lineal energy KW - deconvolution KW - gamma process KW - lifetime KW - measurement system analysis KW - reliability estimation KW - GaN KW - operational amplifier KW - proton therapy KW - prompt gamma imaging KW - 3D X-ray KW - bias temperature-humidity reliability test KW - conductive anodic filament (CAF) KW - de-penalization KW - finite element analysis KW - 3D-IC (three-dimensional integrated circuit) KW - electromagnetic interference KW - near field measurement KW - SAC305 KW - BGA KW - low temperature KW - fracture failure KW - factorial design of experiment KW - genetic algorithm optimization KW - return loss KW - multiple-input multiple-output (MIMO) KW - single event effects KW - linear energy transfer KW - Monte Carlo simulation KW - radiation hardness KW - pressureless sintered micron silver joints KW - deep space environment KW - extreme thermal shocks KW - reconstruction KW - simulation KW - elastic mechanical properties KW - state of health KW - remaining useful life KW - electrochemistry based electrical model KW - semi-empirical capacity fading model KW - useful life distribution KW - quality and reliability assurance KW - single event effect KW - microdosimetry KW - lineal energy KW - deconvolution KW - gamma process KW - lifetime KW - measurement system analysis KW - reliability estimation KW - GaN KW - operational amplifier KW - proton therapy KW - prompt gamma imaging KW - 3D X-ray KW - bias temperature-humidity reliability test KW - conductive anodic filament (CAF) KW - de-penalization KW - finite element analysis UR - https://www.unicat.be/uniCat?func=search&query=sysid:145512649 AB - This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards. ER -