TY - BOOK ID - 145440468 TI - 1972 annual reliability and maintainability symposium held in San Francisco, California, on January 25-27, 1972. Proceedings AU - American Institute Of Industrial Engineers [A.I.I.E.] AU - I.E.E.E. (Institute Of Electrical And Electronics Engineers) AU - American Institute of Aeronautics and Astronautics AU - American Society Of Mechanical Engineers AU - A.S.Q.C. AU - Illuminating Engineering Society AU - Society of automotive engineers (Etats-Unis) PY - 1972 PB - New York, NY : IEEE Computer Society Press, DB - UniCat KW - Fiabilite KW - Electronique physique KW - Electronique industrielle UR - https://www.unicat.be/uniCat?func=search&query=sysid:145440468 AB - ER -