TY - BOOK ID - 145365904 TI - ANSI N42.31-2003 : American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation AU - American National Standards Institute. AU - Institute of Electrical and Electronics Engineers PY - 2003 PB - New York : IEEE, DB - UniCat KW - Ionizing radiation. UR - https://www.unicat.be/uniCat?func=search&query=sysid:145365904 AB - Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements. ER -