TY - BOOK ID - 145151799 TI - Third International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas AU - Ambler, Tony AU - Abadir, M AU - International Conference on the Economics of Design, Test, and Manufacturing AU - IEEE Computer Society Test Technology Technical Committee PY - 1994 PB - [Place of publication not identified] IEEE Computer Society Press DB - UniCat KW - Electronic circuits KW - Electronic circuit design KW - Electronic circuits KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Electrical Engineering KW - Costs KW - Congresses KW - Decision making KW - Congresses KW - Testing KW - Costs KW - Congresses UR - https://www.unicat.be/uniCat?func=search&query=sysid:145151799 AB - ER -