TY - BOOK ID - 14305335 TI - Electron Backscatter Diffraction in Materials Science AU - Schwartz, Adam J. AU - Kumar, Mukul. AU - Adams, Brent L. AU - Field, David P. PY - 2009 SN - 0387881352 9786612825804 0387881360 1282825801 1489993347 PB - New York, NY : Springer US : Imprint: Springer, DB - UniCat KW - Crystallography. KW - Materials -- Microscopy. KW - Scanning electron microscopy. KW - Materials KW - Scanning electron microscopy KW - Crystallography KW - Chemical & Materials Engineering KW - Engineering & Applied Sciences KW - Materials Science KW - Microscopy KW - Microscopy. KW - Leptology KW - Materials science. KW - Geophysics. KW - Condensed matter. KW - Materials Science. KW - Characterization and Evaluation of Materials. KW - Materials Science, general. KW - Condensed Matter Physics. KW - Geophysics/Geodesy. KW - Electron microscopy KW - Physical sciences KW - Mineralogy KW - Surfaces (Physics). KW - Materials. KW - Physical geography. KW - Geography KW - Engineering KW - Engineering materials KW - Industrial materials KW - Engineering design KW - Manufacturing processes KW - Physics KW - Surface chemistry KW - Surfaces (Technology) KW - Geological physics KW - Terrestrial physics KW - Earth sciences KW - Condensed materials KW - Condensed media KW - Condensed phase KW - Materials, Condensed KW - Media, Condensed KW - Phase, Condensed KW - Liquids KW - Matter KW - Solids KW - Material science UR - https://www.unicat.be/uniCat?func=search&query=sysid:14305335 AB - Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique. ER -