TY - BOOK ID - 14301682 TI - Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations AU - Garg, Rajesh. AU - Khatri, Sunil P. PY - 2010 SN - 1441909303 144190932X 1282836811 1441909311 9786612836817 1489985107 PB - New York ; London : Springer, DB - UniCat KW - Integrated circuits -- Very large scale integration. KW - Integrated circuits. KW - Very large scale integration. KW - Integrated circuits KW - Electrical Engineering KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Very large scale integration KW - Fault-tolerant computing. KW - Computing, Fault-tolerant KW - Very large scale integration of circuits KW - VLSI circuits KW - Engineering. KW - Computer-aided engineering. KW - Electronic circuits. KW - Circuits and Systems. KW - Computer-Aided Engineering (CAD, CAE) and Design. KW - Electronic data processing KW - Electronic digital computers KW - Fault tolerance (Engineering) KW - Computer system failures KW - Reliability KW - Systems engineering. KW - Computer aided design. KW - Engineering systems KW - System engineering KW - Engineering KW - Industrial engineering KW - System analysis KW - CAD (Computer-aided design) KW - Computer-assisted design KW - Computer-aided engineering KW - Design KW - Design and construction KW - CAE KW - Electron-tube circuits KW - Electric circuits KW - Electron tubes KW - Electronics KW - Data processing UR - https://www.unicat.be/uniCat?func=search&query=sysid:14301682 AB - This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers. ER -