TY - BOOK ID - 137522012 TI - Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California AU - Rajsuman, Rochit AU - Rajkanan, K AU - IEEE International Workshop on Memory Technology, Design and Testing AU - IEEE International Workshop on Memory Technology, Design, and Testing AU - IEEE Computer Society Test Technology Technical Committee AU - IEEE Computer Society Technical Committee on VLSI PY - 1995 PB - [Place of publication not identified] IEEE Computer Society Press DB - UniCat KW - Semiconductor storage devices KW - Random access memory KW - Testing KW - Congresses KW - Congresses. UR - https://www.unicat.be/uniCat?func=search&query=sysid:137522012 AB - ER -