TY - BOOK ID - 136491195 TI - Defects and properties of semiconductors : defect engineering PY - 1987 SN - 9027723524 PB - Tokyo KTK scientific publ. DB - UniCat KW - Semiconductors KW - Defects KW - Congresses UR - https://www.unicat.be/uniCat?func=search&query=sysid:136491195 AB - ER -