TY - BOOK ID - 136198922 TI - DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA AU - Menon, Sankaran M AU - IEEE International Workshop on Defect Based Testing AU - IEEE Computer Society Test Technology Technical Committee PY - 2004 PB - [Place of publication not identified] IEEE DB - UniCat KW - Metal oxide semiconductors, Complementary KW - Integrated circuits KW - Iddq testing KW - Defects UR - https://www.unicat.be/uniCat?func=search&query=sysid:136198922 AB - ER -