TY - BOOK ID - 135518079 TI - Pulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor AU - Griffin, Timothy E. AU - U.S. Army Research Laboratory. PY - 2006 PB - Adelphi, MD : Army Research Laboratory, DB - UniCat KW - Pulsed power systems. KW - Diodes, Schottky-barrier. KW - Metal oxide semiconductors. UR - https://www.unicat.be/uniCat?func=search&query=sysid:135518079 AB - ER -