TY - BOOK ID - 134988070 TI - Lock-in thermography : basics and use for functional diagnostics of electronic components AU - Breitenstein, O. AU - Langenkamp, M. PY - 2003 SN - 3540434399 9783540434399 PB - New York Springer DB - UniCat KW - Electronic apparatus and appliances KW - Semiconductors KW - Thermography KW - Testing KW - Thermal properties UR - https://www.unicat.be/uniCat?func=search&query=sysid:134988070 AB - "The book provides a useful introduction to this technique and a helpful guide for scientists and engineers working in this field. It concludes with a detailed theoretical treatment of the propagation of thermal waves, which is presented as a basis for various applications, e.g., integrated devices, MOS structures, solar cells and solar molecules."--Jacket. ER -