TY - BOOK ID - 134917832 TI - Noise temperature measurements on wafer AU - Randa, James. AU - United States. PY - 1997 PB - Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, DB - UniCat KW - Electronic noise KW - Measurement. UR - https://www.unicat.be/uniCat?func=search&query=sysid:134917832 AB - ER -