ID - 131771071 TI - VLSI test principles and architectures : design for testability AU - Wang, Laung-Terng. AU - Wu, Cheng-Wen AU - Wen, Xiaoqing. PY - 2006 SN - 9780080474793 0080474799 9780123705976 0123705975 128096684X 1493300865 9786610966844 9781280966842 PB - Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, DB - UniCat KW - Integrated circuits KW - Very large scale integration KW - Design. KW - Testing. UR - https://www.unicat.be/uniCat?func=search&query=sysid:131771071 AB - This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.· ER -