TY - GEN digital ID - 131668709 TI - Progress in Nanoscale Characterization and Manipulation AU - Wang, Rongming AU - Wang, Chen AU - Zhang, Hongzhou AU - Tao, Jing AU - Bai, Xuedong PY - 2018 SN - 9789811304545 PB - Singapore Springer Singapore, Imprint: Springer DB - UniCat KW - Optics. Quantum optics KW - Physics KW - Surface chemistry KW - Theoretical spectroscopy. Spectroscopic techniques KW - Materials sciences KW - Electronics KW - materiaalkennis KW - oppervlakte-onderzoek KW - nanotechniek KW - spectroscopie KW - microscopie UR - https://www.unicat.be/uniCat?func=search&query=sysid:131668709 AB - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. ER -