ID - 131584961 TI - Optimised failure detection and advanced non-destructive inspection using active IR thermography and numerical modelling AU - Peeters, Jeroen AU - Universiteit Antwerpen PY - 2017 SN - 9789057285530 PB - Antwerpen Universiteit Antwerpen DB - UniCat KW - Electrical engineering UR - https://www.unicat.be/uniCat?func=search&query=sysid:131584961 AB - ER -