TY - BOOK ID - 1295084 TI - Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy : a laboratory workbook AU - Lyman, Charles E. AU - Newbury, Dale E. AU - Goldstein, Joseph I. AU - Williams, David B. AU - Romig, Alton D. AU - Armstrong, John T. AU - Echlin, Patrick AU - Fiori, Charles E. AU - Joy, David C. AU - Lifshin, Reic AU - Peters, Klaus-Ruediger PY - 1990 SN - 0306435918 1461306353 9780306435911 PB - New York, N.Y. Plenum Press DB - UniCat KW - Experimental solid state physics KW - Electron microscopy KW - -Scanning electron microscopy KW - -X-ray microanalysis KW - -Microprobe analysis KW - Microscopy KW - Laboratory manuals KW - -Laboratory manuals KW - Scanning electron microscopy KW - X-ray microanalysis KW - Microprobe analysis KW - SCANNING ELECTRON MICROSCOPY KW - X-RAY MICROANALYSIS KW - ELECTRON MICROSCOPY KW - MANUALS UR - https://www.unicat.be/uniCat?func=search&query=sysid:1295084 AB - ER -