TY - BOOK ID - 107477206 TI - Functional Design Errors in Digital Circuits : Diagnosis, Correction and Repair AU - Chang, Kai-hui AU - Markov, Igor L AU - Bertacco, Valeria AU - SpringerLink (Online service) PY - 2009 SN - 9781402093654 PB - Dordrecht Springer Netherlands DB - UniCat KW - Logic KW - Electrical engineering KW - Programming KW - Artificial intelligence. Robotics. Simulation. Graphics KW - ontwerpen KW - KI (kunstmatige intelligentie) KW - CAD (computer aided design) KW - elektrische circuits UR - https://www.unicat.be/uniCat?func=search&query=sysid:107477206 AB - Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. ER -