TY - BOOK ID - 10603574 TI - Yield and reliability in microwave circuit and system design. AU - Meehan, Michael D. AU - Purviance, John PY - 1993 SN - 0890065276 PB - Boston Artech house DB - UniCat KW - Computer-aided design KW - Engineering design KW - -Microwave integrated circuits KW - -Integrated circuits KW - Microwave circuits KW - Design, Engineering KW - Engineering KW - Industrial design KW - Strains and stresses KW - CAD (Computer-aided design) KW - Computer-assisted design KW - Computer-aided engineering KW - Design KW - Statistical methods KW - Design and construction KW - Computer-aided design. KW - Microwave integrated circuits KW - Statistical methods. KW - -Statistical methods KW - Design and construction&delete& KW - Integrated circuits UR - https://www.unicat.be/uniCat?func=search&query=sysid:10603574 AB - ER -