TY - BOOK ID - 103694447 TI - Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in nanoCMOS AU - Posser, Gracieli AU - Sapatnekar, Sachin S. AU - Reis, Ricardo A. L. PY - 2016 SN - 3319488988 3319488996 9783319488981 PB - Cham Springer DB - UniCat KW - Metal oxide semiconductors, Complementary KW - Electrodiffusion KW - Nanoelectromechanical systems KW - Nano-electro-mechanical systems KW - Nanoelectromechanical devices KW - Nanomechanical devices KW - Nanomechanical machines KW - Nanomechanical systems KW - Nanometer scale devices KW - Nanoscale devices KW - Nanoscale electronic devices KW - Nanostructured devices KW - NEMS (Nanotechnology) KW - Electromechanical devices KW - Nanoelectronics KW - Nanostructures KW - Electromigration KW - Electrotransport KW - Diffusion KW - Physical metallurgy KW - Transport theory KW - CMOS (Electronics) KW - Complementary metal oxide semiconductors KW - Semiconductors, Complementary metal oxide KW - Digital electronics KW - Logic circuits KW - Transistor-transistor logic circuits UR - https://www.unicat.be/uniCat?func=search&query=sysid:103694447 AB - ER -