TY - BOOK ID - 101581405 TI - 2022 IEEE 40th VLSI Test Symposium (VTS) PY - 2022 SN - 1665410604 1665410612 9781665410601 PB - Piscataway, New Jersey : IEEE, DB - UniCat KW - Integrated circuits KW - Very large scale integration KW - Testing UR - https://www.unicat.be/uniCat?func=search&query=sysid:101581405 AB - The premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing field of VLSI Test. ER -