TY - BOOK ID - 100587474 TI - RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range PY - 2018 SN - 1000084392 3731508222 PB - KIT Scientific Publishing DB - UniCat KW - On-Wafer Measurements KW - Monolithic Microwave Integrated Circuits KW - Halbleiterschaltungen KW - Messtechnik KW - Hochfrequenztechnik KW - Electromagnetic Field Simulation KW - Elektromagnetische Feldsimulation KW - Radio Frequency UR - https://www.unicat.be/uniCat?func=search&query=sysid:100587474 AB - Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. ER -