Authors: Albrecht, W. --- Arneth, Reinhold --- Berg, W. F. --- Bethe, Günther --- Byrne, J. F. --- et al. Camenisch, H. --- Comizzoli, R. B. --- Dannert, H. --- Dessauer, John --- Eckenbach, W. --- Epping, R. H. --- Fridkin, V. M. --- Gaidelis, V. --- Hauffe, K. --- Heiland, G. --- Hercock, R. J. --- Hirsch, H.-J. --- Inoue, Eiichi --- Ionescu, N. I. --- Jung, M. --- Jurevicius, D. --- Kassel, K. H. --- Kiess, H. --- Kosche, H. H. --- Lanker, W. --- Lewis, R. B. --- Leysen, R. --- Lu Valle, James E. --- Löhr, Bernd --- Mammino, J. --- Matulionis, A. --- Meier, H. --- Meskuotiene, E. --- Meyer-Laack, A. --- Montrimas, E. --- Moraw, R. --- Morrison, S. Roy --- Pazera, A. --- Petrikat, K. --- Pocius, Z. --- Pusch, H. --- Radler, R. W. --- Rakauskas, J. --- Range, J. --- Rein, D. --- Rochlitz, Jürgen --- Sablin-Javorski, A. D. --- Schaffert, R. M. --- Stark, H. M. --- Stockman, David L. --- Stotz, S. --- Suys, A. --- Tauraitiene, S. --- Tauraitis, A. --- Tschirwitz, U. --- Verhille, K. --- Viščakas, J. --- Weigl, J. W. --- Whittaker, G. L. --- Winkelmann, Detlef --- van Hove, H.
ISBN: 9783111507743 9783110036992 Year: 2018 Publisher: Berlin ;; Boston De Gruyter