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Interferometry, the most precise measurement technique known today, exploits the wave-like nature of the atoms or photons in the interferometer. As expected from the laws of quantum mechanics, the granular, particle-like features of the individually independent atoms or photons are responsible for the precision limit, the shot noise limit. However this classical  bound is not fundamental and it is the aim of quantum metrology to overcome it by employing entanglement among the particles. This work reports on the realization of spin-squeezed states suitable for atom interferometry. Spin squeezing was generated on the basis of motional and spin degrees of freedom, whereby the latter allowed the implementation of a full interferometer with quantum-enhanced precision.

Measuring methods in physics --- Chemical laboratory practice --- procescontrole --- laboratoriuminstrumenten --- meetkundige instrumenten --- micro-elektronica --- elektrische meettechniek

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Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the traditional  method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: ¢solutions to several common reliability issues in microsystem technology, ¢methods to understand and predict failure mechanisms at interfaces between dissimilar materials and ¢an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.    

Electronics and optics of solids --- Solid state physics --- Chemical structure --- Biotechnology --- nanotechniek --- biotechnologie --- fysica --- micro-elektronica --- transistoren --- halfgeleiders

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Electronics and optics of solids --- Solid state physics --- Chemical structure --- Biotechnology --- nanotechniek --- biotechnologie --- fysica --- micro-elektronica --- transistoren --- halfgeleiders

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This book provides a detailed discussion and commentary on the fundamentals of metrology. The fundamentals of metrology, the principles underlying the design of the SI International System of units, the theory of measurement error, a new methodology for estimation of measurement accuracy based on uncertainty, and methods for reduction of measured results and estimation of measurement uncertainty are all discussed from a modern point of view. The concept of uncertainty is shown to be consistent with the classical theory of accuracy. The theory of random measurement errors is supplemented by a very general description based on the generalized normal distribution; systematic instrumental error is described in terms of a methodology for normalizing the metrological characteristics of measuring instruments. A new international system for assuring uniformity of measurements based on agreements between national metrological institutes is discussed, in addition to the role and procedure for performance of key comparisons between national standards. The conclusion describes a new methodology for assurance of measurement accuracy (based on the provisions contained in the ISO 5725-series standards) that is now becoming more and more common around the world. All of the theoretical statements and calculation methods are illustrated using examples. This book will be of interest to personnel working in government metrological services (or in the metrological services of legal entities), and to specialists who use measuring instruments or make use of measured data in their daily activities It will be useful to students at technical universities when studying the academic disciplines of Metrology, Standardization, and Certification; Metrology and Measurement Assurance; and Metrology and Measuring Instruments.

Operational research. Game theory --- Measuring methods in physics --- Chemical laboratory practice --- Production management --- procescontrole --- laboratoriuminstrumenten --- meetkundige instrumenten --- stochastische analyse --- kwaliteitscontrole --- kansrekening --- micro-elektronica --- elektrische meettechniek

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This book presents the practical aspects of mass measurements. Concepts of gravitational, inertial and conventional mass and details of the variation of acceleration of gravity are described. The Metric Convention and International Prototype Kilogram and BIPM standards are described. The effect of change of gravity on the indication of electronic balances is derived with respect of latitude, altitude and earth topography. The classification of weights by OIML is discussed. Maximum permissible errors in different categories of weights prescribed by national and international organizations are presented. Starting with the necessity of redefining the unit kilogram in terms of physical constants, various methods of defining the kilogram in terms of physical constants are described. The kilogram can be defined by Avogadro's constant, ion collection of some heavy elements, levitation, voltage and Watt Balance. The detection of very small mass of the order of zeptogram through Nanotechnolgy is also discussed. Latest recommendations of CIPM are given.

Measuring methods in physics --- Classical mechanics. Field theory --- Chemical laboratory practice --- Materials sciences --- procescontrole --- materiaalkennis --- laboratoriuminstrumenten --- toegepaste mechanica --- meetkundige instrumenten --- mechanica --- micro-elektronica --- elektrische meettechniek