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This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope. Written from the user perspective by the developers of the instrument themselves Covers the main features of a local electrode atom probe tomography experiment from start to finish Contains practical hints and  tutorial information that is useful to any atom probe operator to improve the chances of a  successful analysis Includes a chapter on hardware/instrumentation, which explains to the novice user the various parts of the instrument and how they operate Provides an overview of the software methods employed in LEAP, including reconstruction and data analysis.

Integrated circuits -- Ultra large scale integration. --- Mass spectrometry. --- Atom-probe field ion microscopy --- Nanochemistry --- Nanotechnology --- Surfaces (Physics) --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Materials Science --- Tomography. --- Atom-probe field ion microscopy. --- Body section radiography --- Computed tomography --- Computerized tomography --- CT (Computer tomography) --- Laminagraphy --- Laminography --- Radiological stratigraphy --- Stratigraphy, Radiological --- Tomographic imaging --- Zonography --- Materials science. --- Nanochemistry. --- Nanoscale science. --- Nanoscience. --- Nanostructures. --- Spectroscopy. --- Microscopy. --- Nanotechnology. --- Materials Science. --- Characterization and Evaluation of Materials. --- Nanoscale Science and Technology. --- Spectroscopy and Microscopy. --- Field ion microscopy --- Cross-sectional imaging --- Radiography, Medical --- Geometric tomography --- Surfaces (Physics). --- Molecular technology --- Nanoscale technology --- High technology --- Nanoscale chemistry --- Chemistry, Analytic --- Nanoscience --- Physics --- Surface chemistry --- Surfaces (Technology) --- Analytical chemistry --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Nano science --- Nanoscale science --- Nanosciences --- Science --- Material science --- Physical sciences --- Qualitative

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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined. Serves as a concise but authoritative introduction to the latest innovation in scanning microscopy Compares ion and electron beams as options for microscopy Presents a detailed physical model of ion-solid interactions and signal generation Provides a detailed database of iSE yield behavior as a function of the target ion, element, and energy.

Field ion microscopy. --- Helium ions. --- Ion bombardment. --- Field ion microscopy --- Helium ions --- Ion bombardment --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Materials Science --- Microscopy. --- Spectrum analysis. --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Materials science. --- Spectroscopy. --- Nanoscale science. --- Nanoscience. --- Nanostructures. --- Nanotechnology. --- Materials Science. --- Characterization and Evaluation of Materials. --- Spectroscopy and Microscopy. --- Spectroscopy/Spectrometry. --- Nanoscale Science and Technology. --- Optics --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Surfaces (Physics). --- Molecular technology --- Nanoscale technology --- High technology --- Physics --- Surface chemistry --- Surfaces (Technology) --- Spectrometry --- Nanoscience --- Nano science --- Nanoscale science --- Nanosciences --- Science --- Material science --- Physical sciences --- Analytical chemistry