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Interfaces of solid materials play an increasingly important role when the size of active elements used in different areas of science and technology shrinks to the nanometer range. This has required development of analytical tools specifically sensitive to the properties of a material in the vicinity of its boundary with other phase (a heterojunction). The present book is the first to describe the basics of internal photoemission spectroscopy - a method based on the detection of electron transitions from one solid to another. This spectroscopy combines the interface sensitivity typical of conv
Photoelectron spectroscopy. --- Photoemission. --- Semiconductors --- Junctions.
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X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and
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Photoelectron spectroscopy. --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis
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Handbook of Mineral Spectroscopy, Volume Two: Infrared Spectra, a Four Volume Set presents a database of Infrared spectra, showing both full spectra and high-resolution spectral regions with band component analyses of rock-forming and major ore minerals. IR of minerals is a very powerful technique for analyzing the different vibrational modes of minerals (in particular functional groups) but also the local environment of atoms in a crystal structure. The book includes a section on silicates and one on non-silicates, subdivided according to the normal mineral classes.
Photoelectron spectroscopy. --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis --- Infrared spectroscopy. --- Mineralogy --- Analysis.
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The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning
Photoelectron spectroscopy. --- Photoemission. --- Semiconductors -- Junctions. --- Photoelectron spectroscopy --- Photoemission --- Semiconductors --- Chemistry --- Physics --- Physical Sciences & Mathematics --- Analytical Chemistry --- Light & Optics --- Junctions --- Junctions. --- Emission, Photoelectric --- External photoelectric effect --- Photoelectric effect, External --- Photoelectric emission --- Electrons --- Photoelectricity --- Junctions, Semiconductor --- Semiconductor interface --- Semiconductor interfaces --- Semiconductor junctions --- Interfaces (Physical sciences) --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Spectrum analysis --- Emission --- Interfaces
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Electronic and photoelectron spectroscopy can provide extraordinarily detailed information on the properties of molecules and are in widespread use in the physical and chemical sciences. Applications extend beyond spectroscopy into important areas such as chemical dynamics, kinetics and atmospheric chemistry. This book aims to provide the reader with a firm grounding of the basic principles and experimental techniques employed. The extensive use of case studies effectively illustrates how spectra are assigned and how information can be extracted, communicating the matter in a compelling and instructive manner. Topics covered include laser-induced fluorescence, resonance-enhanced multiphoton ionization, cavity ringdown and ZEKE spectroscopy. The volume is for advanced undergraduate and graduate students taking courses in spectroscopy and will also be useful to anyone encountering electronic and/or photoelectron spectroscopy during their research.
Photoelectron spectroscopy --- Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Spectroscopy, Photoelectron --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis --- Study and teaching. --- Emission --- Study and teaching --- Photoelectron spectroscopy - Study and teaching --- Electron spectroscopy - Study and teaching
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This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Physical & Theoretical Chemistry --- Atomic Physics --- Chemistry --- Physics --- Physical Sciences & Mathematics --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy --- Spectroscopy. --- Surfaces (Physics). --- Atomic/Molecular Structure and Spectra. --- Spectroscopy/Spectrometry. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surface and Interface Science, Thin Films. --- Surface chemistry --- Surfaces (Technology) --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Atomic structure . --- Molecular structure . --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Interfaces (Physical sciences). --- Surfaces (Physics) --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Spectrometry --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Analytical chemistry
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. .
X-ray photoelectron spectroscopy. --- Auger effect. --- Auger spectroscopy --- Auto-ionization --- Autoionization --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Physics. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Materials --- Thin films. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surfaces. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Natural philosophy --- Philosophy, Natural --- Physical sciences --- Dynamics --- Surfaces --- Qualitative --- Electron spectroscopy for chemical analysis --- Photoelectron spectroscopy --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Surfaces (Physics). --- Surface chemistry --- Materials—Surfaces. --- Spectrometry --- Analytical chemistry
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Jonelle Harvey’s thesis outlines two related experimental techniques which are utilised to investigate small halogenated molecules: threshold photoelectron spectroscopy and threshold photoelectron photoion coincidence techniques. All the experiments were conducted at the vacuum ultraviolet beamline of the Swiss Light Source, which is a synchrotron photon source offering easy tunability. In this thesis, three studies are presented which combine experimental and computational ab initio approaches. The first study involves the fast dissociation of halogenated methanes in order to construct a self-consistent thermochemical network. The second study investigates the fragmentations of fluoroethenes from timebombs, which break apart very slowly but explosively, to fast dissociators. The third study uncovers how vital conical interactions underpin both the results of photoelectron spectra and dissociation patterns.The details included in this work are useful for researchers in the same field as well as those readers wishing to obtain a solid introduction into the types of systems encountered in threshold photoelectron photoion coincidence spectroscopy.
Chemistry. --- Halogenation. --- Physical chemistry. --- Chemistry, Physical and theoretical. --- Atomic structure. --- Molecular structure. --- Spectra. --- Physical Chemistry. --- Atomic/Molecular Structure and Spectra. --- Theoretical and Computational Chemistry. --- Physical sciences --- Chemistry, Physical organic. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Atomic structure . --- Molecular structure . --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Photoelectron spectroscopy. --- Dissociation. --- Halocarbons.
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